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Exhibition at VUVX conference
XCAM was invited to attend the Vacuum Ultraviolet and X-ray conference at ETH in Zurich to present a poster on the development of the RIXSCam system, one of which was recently commissioned on the ADRESS beamline at the Swiss Light Source. The biannual conference is the third successive conference following a merger of two long-standing conference series. Major topics of interest at the conference were resonant inelastic x-ray scattering (RIXS) and angle-resolved photoemission spectroscopy (ARPES). The XCAM poster summarised the key features of the RIXSCam and early results and can be read here (link to the literature page). It was exciting to see a range of experiments aimed at developing our understanding of the electronic structure of various materials.